Inelastic x-ray scattering measurements of phonons
Our group uses inelastic x-ray scattering (IXS) at synchrotrons to measure phonons in crystalline materials, as a function of temperature and pressure. IXS can measure small samples ~100 microns in size.
Delaire group measuring phonons with inelastic x-ray scattering at HERIX/APS
Delaire group measuring phonons at high pressure with inelastix x-ray scattering
Delaire group measuring phonons with inelastic x-ray scattering at HERIX/APS
Delaire group measuring phonons with inelastic x-ray scattering at APS sector-3.
Delaire group measuring phonons with inelastic x-ray scattering at APS sector-3.
Delaire group measuring phonons with inelastic x-ray scattering at APS sector-3.
